X-ray triple-crystal diffractometry of defects in epitaxic layers

被引：0

作者：

机构：

[1] Holy, V.

[2] Wolf, K.

[3] Kastner, M.

[4] Stanzl, H.

[5] Gebhardt, W.

来源：

Holy, V. | 1600年 / Int Union of Crystallography, Copenhagen, Denmark卷 / 27期

关键词：

Crystal defects;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

共 50 条

[41] INVESTIGATION OF SURFACE-LAYER STRUCTURE OF SINGLE-CRYSTALS WITH TRIPLE-CRYSTAL X-RAY-DIFFRACTOMETRY
KAZIMIROV, AY
KOVALCHUK, MV
KOHN, VG
ACTA CRYSTALLOGRAPHICA SECTION A, 1990, 46 : 643 - 649
[42] APPLICATIONS OF X-RAY TRIPLE CRYSTAL DIFFRACTOMETRY TO STUDIES ON THE DIFFUSION-INDUCED DEFECTS IN SILICON-CRYSTALS
IIDA, A
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1979, 54 (02): : 701 - 706
[43] The X-ray triple crystal diffractometry of silicon monocrystals with ordered dislocation structure
Novikov, NN
Shevtsiv, IV
Shvidky, VA
Teselko, PO
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1997, 161 (01): : 35 - 43
[44] Double- and triple-crystal x-ray diffraction analysis of semiconductor quantum wires
Tapfer, L.
Sciacovelli, P.
De Caro, L.
Journal of Physics D: Applied Physics, 1995, 28 (4A):
[45] X-RAY-DIFFRACTION STUDIES OF ANNEALED CZOCHRALSKI-GROWN SILICON .2. TRIPLE-CRYSTAL DIFFRACTOMETRY
ZAUMSEIL, P
JOKSCH, S
ZULEHNER, W
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1993, 26 : 192 - 197
[46] Hybrid reciprocal space for X-ray diffraction in epitaxic layers
Morelhao, Sergio L.
Domagala, Jarek Z.
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2007, 40 : 546 - 551
[47] PENDELLOSUNG EFFECTS AS A TOOL FOR EXAMINING MINUTE STRAINS WITH A TRIPLE-CRYSTAL X-RAY SPECTROMETER
ALSTRUP, O
ACTA CRYSTALLOGRAPHICA SECTION A, 1978, 34 (MAY): : 362 - 367
[48] X-Ray Diffractometry of Thin Layers - Possibilities and Problems
Zucha, Vladimir
Jackuliak, Quido
ADVANCES IN ELECTRICAL AND ELECTRONIC ENGINEERING, 2005, 4 (02) : 55 - 57
[49] CHARACTERIZATION OF POROUS SILICON LAYERS BY MEANS OF X-RAY DOUBLE-CRYSTAL DIFFRACTOMETRY
SUGIYAMA, H
NITTONO, O
ISIJ INTERNATIONAL, 1989, 29 (03) : 223 - 228
[50] Strain inhomogeneity mapping in single-crystal layers and membranes by X-ray diffractometry
Zsoldos, L
Gröger, V
Haugeneder, E
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2002, 35 : 17 - 20

← 1 2 3 4 5 →