X-ray triple-crystal diffractometry of defects in epitaxic layers

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[1] Holy, V.
[2] Wolf, K.
[3] Kastner, M.
[4] Stanzl, H.
[5] Gebhardt, W.
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Holy, V. | 1600年 / Int Union of Crystallography, Copenhagen, Denmark卷 / 27期
关键词：
Crystal defects;
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