Measurement of fractal dimension from surface asperity profile

被引：0
|
作者：
Sasajima, K. [1 ]
Tsukada, T. [1 ]
机构：
[1] Saitama Univ, Saitama, Japan
来源：
International Journal of Machine Tools and Manufacture | 1992年 / 32卷 / 1-2期
关键词：
Auto-correlation length - Fractal dimension measurement - Normalized reticular cell counting method - Surface asperity profile;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：125 / 127
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