REASONS AND PREVENTIVE METHODS FOR CATASTROPIC FAILURES IN PRINTED CIRCUITS.

被引：0

作者：

Kear, Fred W.

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来源：

Insulation/Circuits | 1973年 / 19卷 / 13期

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摘要：

The four basic failure modes that can be considered catastropic failures are: short circuits, dielectric breakdown, open circuits, and mechanical failures. This article considers all of these failure modes as they are related to various facets of the design and production cycles.

引用

页码：49 / 51

共 48 条

[21] Two Methods for Testing Microprogrammed Circuits.
Radnai, Rudolf
1978, 26 (11): : 417 - 420
[22] Laser Beam Application for Ceramic Substrates of Printed Circuits.
Isert, Hans
Wilczek, Peter
Sprechsaal, 1982, 115 (12): : 1090 - 1093
[23] New Developments in the Additive Technique of Manufacture of Printed Circuits.
Egerer, Karl A.
Galvanotechnik, 1976, 67 (11): : 896 - 907
[24] EVALUATION OF METHODS FOR PASSIVATING SILICON INTEGRATED CIRCUITS.
Jones Jr., R.E.
1600, (18):
[25] METHODS FOR SIMPLIFICATION OF REDUNDANT STRUCTURES OF ELECTRIC CIRCUITS.
Chernorutskii, I.G.
Power engineering New York, 1985, 23 (05): : 92 - 98
[26] Carbon dioxide technology platform: From dry cleaning to printed circuits.
DeSimone, J
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2001, 222 : U406 - U406
[27] Stability and Accuracy of Integral Design Methods of Nonlinear Circuits.
Dobkin, L.I.
Izvestiya Vysshikh Uchebnykh Zavedenij. Radioelektronika, 1975, 18 (06): : 127 - 129
[28] INSERTION METHODS FOR PRINTED-CIRCUITS
LACHMANN, HD
GALVANOTECHNIK, 1979, 70 (11): : 1157 - &
[29] Methods for the Computer-Aided Optimization of Integration MIS Circuits.
Fischer, Peter
Riedel, Friedberth
1978, 8 (05): : 433 - 444
[30] Case Study of Design Methods for Equipment-oriented Circuits.
Balogh, Barnabas
Simon, Zoltan
Szolgay, Peter
Meres es automatika, 1983, 31 (08): : 284 - 290

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