X-ray diffraction of samples irradiated by intensive atomic flows of low energy

被引：0
|
作者：
Volosov, V.I. [1 ]
Tolochko, B.P. [1 ]
Churkin, I.N. [1 ]
机构：
[1] Budker Inst of Nuclear Physics, Novosibirsk, Russia
来源：
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 1998年 / 405卷 / 2-3期
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摘要：
7
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页码：463 / 465
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