Cr/Sc multilayers for the soft-x-ray range

被引：0
|
作者：
Schäfers, Franz [1 ]
Mertins, Hans-Christoph [1 ]
Schmolla, Frank [1 ]
Packe, Ingo [1 ]
Salashchenko, Nikolay N. [2 ]
Shamov, Eugeny A. [2 ]
机构：
[1] BESSY mbH, Lentzeallee 100, D-14195 Berlin, Germany
[2] Inst. for Physics of Microstructures, Russian Academy of Sciences, 603600 Nizhny Novgorod GSP 105, Russia
来源：
Applied Optics | 1998年 / 37卷 / 04期
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页码：719 / 728
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