PRESENT AND FUTURE CCDs FOR UV AND X-RAY SCIENTIFIC MEASUREMENTS.

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作者：
Janesick, James R. [1 ]
Elliott, S.Thomas [1 ]
McCarthy, James K. [1 ]
Marsh, Harry H. [1 ]
Collins, Stewart A. [1 ]
Blouke, Morley M. [1 ]
机构：
[1] JPL, Pasadena, CA, USA, JPL, Pasadena, CA, USA
来源：
| 1600年 / NS-32期
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摘要：
SEMICONDUCTOR DEVICES, CHARGE COUPLED
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