PRESENT AND FUTURE CCDs FOR UV AND X-RAY SCIENTIFIC MEASUREMENTS.

被引：0
|
作者：
Janesick, James R. [1 ]
Elliott, S.Thomas [1 ]
McCarthy, James K. [1 ]
Marsh, Harry H. [1 ]
Collins, Stewart A. [1 ]
Blouke, Morley M. [1 ]
机构：
[1] JPL, Pasadena, CA, USA, JPL, Pasadena, CA, USA
来源：
| 1600年 / NS-32期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
SEMICONDUCTOR DEVICES, CHARGE COUPLED
引用
收藏
相关论文
共 50 条
  • [1] PRESENT AND FUTURE CCDS FOR UV AND X-RAY SCIENTIFIC MEASUREMENTS
    JANESICK, JR
    ELLIOTT, ST
    MCCARTHY, JK
    MARSH, HH
    COLLINS, SA
    BLOUKE, MM
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1985, 32 (01) : 409 - 416
  • [2] CCDs for future X-ray astronomy missions
    Holland, AD
    EUX, X-RAY, AND GAMMA-RAY INSTRUMENTATION FOR ASTRONOMY VIII, 1997, 3114 : 586 - 597
  • [3] POTENTIAL OF CCDS FOR UV AND X-RAY PLASMA DIAGNOSTICS
    JANESICK, JR
    ELLIOTT, T
    MARSH, HH
    COLLINS, S
    MCCARTHY, JK
    BLOUKE, MM
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1985, 56 (05): : 796 - 801
  • [4] Reliability of X-Ray Tensometric Measurements.
    Kraus, Ivo
    Kralova, Rudolfa
    Mikolasek, Miroslav
    Saleh, Hosam
    Kovove Materialy, 1979, 17 (03): : 363 - 368
  • [5] The use of CCDs and EM-CCDs for future soft X-ray Spectrometers
    Tutt, James H.
    Holland, Andrew D.
    Murray, Neil J.
    Hall, David J.
    Endicott, James
    McEntaffer, Randall L.
    SPACE TELESCOPES AND INSTRUMENTATION 2012: ULTRAVIOLET TO GAMMA RAY, 2012, 8443
  • [6] The thermal expansion of bismuth by X-ray measurements.
    Jay, AH
    PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-CONTAINING PAPERS OF A MATHEMATICAL AND PHYSICAL CHARACTER, 1934, 143 (A849) : 0465 - 0472
  • [7] A high temperature X-ray camera for quantitative measurements.
    Jay, AH
    ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 1933, 86 (1/2): : 106 - 111
  • [8] Mobile X-Ray Machine for Internal Stress Measurements.
    Franz, H.E.
    Kuehnle, H.
    1600, (29):
  • [9] CHARACTERIZATION OF MULTILAYER X-RAY ANALYZERS: MODELS AND MEASUREMENTS.
    Henke, B.L.
    Uejio, J.Y.
    Yamada, H.T.
    Tackaberry, R.E.
    1600, (25):
  • [10] Electron-multiplying CCDs for future soft X-ray spectrometers
    Tutt, J. H.
    Holland, A. D.
    Murray, N. J.
    Harriss, R. D.
    Hall, D. J.
    Soman, M.
    JOURNAL OF INSTRUMENTATION, 2012, 7
12345