Evaluation of parameters in atmospheric-pressure chemical vapor deposition of borophosphosilicate glass using tetraethylorthosilicate and ozone

被引:0
|
作者
Nishimoto, Y. [1 ]
Tokumasu, N. [1 ]
Maeda, K. [1 ]
机构
[1] Semiconductor Process Lab. Co., Ltd., 13-29 Konan 2-chome, Minato-Ku, Tokyo 108-0075, Japan
来源
| 2001年 / Japan Society of Applied Physics卷 / 40期
关键词
Atmospheric pressure chemical vapor deposition - Borophosphosilicate glass - Tetraethylorthosilicate - Thermal shrinkage;
D O I
10.1143/jjap.40.l1078
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [21] THE EFFECTS OF ALKOXY FUNCTIONAL-GROUPS ON ATMOSPHERIC-PRESSURE CHEMICAL-VAPOR-DEPOSITION USING ALKOXYSILANE AND OZONE
    IKEDA, K
    NAKAYAMA, S
    MAEDA, M
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1995, 142 (05) : 1659 - 1662
  • [22] STEP-COVERAGE SIMULATION FOR TETRAETHOXYSILANE AND OZONE ATMOSPHERIC-PRESSURE CHEMICAL-VAPOR-DEPOSITION
    FUJINO, K
    EGASHIRA, Y
    SHIMOGAKI, Y
    KOMIYAMA, H
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1993, 140 (08) : 2309 - 2312
  • [23] Atmospheric-pressure spatial chemical vapor deposition of tungsten oxide
    Yeow, Travis Wen-Kai
    Mistry, Kissan
    Shahin, Ahmed
    Yavuz, Mustafa
    Musselman, Kevin P.
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2020, 38 (05):
  • [24] Characteristics of silicon dioxide film prepared by atmospheric-pressure chemical vapor deposition using tetraethoxysilane and ozone with alcohol addition
    NTT LSI Lab, Atsugi, Japan
    Jpn J Appl Phys Part 1 Regul Pap Short Note Rev Pap, 4 B (2182-2190):
  • [25] Characteristics of silicon dioxide films on patterned substrates prepared by atmospheric-pressure chemical vapor deposition using tetraethoxysilane and ozone
    Ikeda, K
    Nakayama, S
    Maeda, M
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1996, 143 (05) : 1715 - 1718
  • [26] DOPED SILICON-OXIDE DEPOSITION BY ATMOSPHERIC-PRESSURE AND LOW-TEMPERATURE CHEMICAL VAPOR-DEPOSITION USING TETRAETHOXYSILANE AND OZONE
    FUJINO, K
    NISHIMOTO, Y
    TOKUMASU, N
    MAEDA, K
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1991, 138 (10) : 3019 - 3024
  • [27] GAS-PHASE NUCLEATION IN AN ATMOSPHERIC-PRESSURE CHEMICAL VAPOR-DEPOSITION PROCESS FOR SIO2-FILMS USING TETRAETHYLORTHOSILICATE (TEOS)
    ADACHI, M
    OKUYAMA, K
    TOHGE, N
    SHIMADA, M
    SATOH, J
    MUROYAMA, M
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1992, 31 (10A): : L1439 - L1442
  • [28] CHARACTERISTICS OF SILICON DIOXIDE FILM PREPARED BY ATMOSPHERIC-PRESSURE CHEMICAL-VAPOR-DEPOSITION USING TETRAETHOXYSILANE AND OZONE WITH ALCOHOL ADDITION
    IKEDA, K
    NAKAYAMA, S
    MAEDA, M
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1995, 34 (4B): : 2182 - 2190
  • [29] EPITAXIAL SILICON CHEMICAL VAPOR-DEPOSITION BELOW ATMOSPHERIC-PRESSURE
    REGOLINI, JL
    BENSAHEL, D
    MERCIER, J
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1989, 4 (1-4): : 407 - 415
  • [30] Atmospheric-Pressure Chemical Vapor Deposition of Iron Pyrite Thin Films
    Berry, Nicholas
    Cheng, Ming
    Perkins, Craig L.
    Limpinsel, Moritz
    Hemminger, John C.
    Law, Matt
    ADVANCED ENERGY MATERIALS, 2012, 2 (09) : 1124 - 1135