Direct determination of In-dimer orientation of Si(001)2×3-In and 2×2-In surfaces

被引：0
|
作者：
Yeom, H.W. [1 ]
Abukawa, T. [1 ]
Nakamura, M. [1 ]
Chen, X. [1 ]
Suzuki, S. [1 ]
Sato, S. [1 ]
Sakamoto, K. [1 ]
Sakamoto, T. [1 ]
Kono, S. [1 ]
机构：
[1] Tohoku Univ, Sendai, Japan
来源：
Surface Science | 1995年 / 340卷 / 1-2期
关键词：
549.3; Others; including Bismuth; Boron; Cadmium; Cobalt; Mercury; Niobium; Selenium; Silicon; Tellurium and Zirconium - 712.1 Semiconducting Materials - 723.5 Computer Applications - 931.2 Physical Properties of Gases; Liquids and Solids;
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摘要：
20
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