MICROPROCESSOR BOARD TESTING REVIEW TUTORIAL.

被引：0
|
作者：
Anderson, Robert E.
机构：
来源：
| 1978年
关键词：
COMPUTERS; MICROPROCESSOR - Testing - INTEGRATED CIRCUITS - Large Scale Integration;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The increasing use of LSI circuits, in general, and microprocessors in particular, has had a major impact upon testing at the engineering, production, and field service levels. This paper describes the impact of LSI boards upon the traditional test methods at these levels. Necessary changes in test strategy and a typical functional test program for a microprocessor-based board are described. The text of this paper is in digest form.
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页码：118 / 123
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