Thermodynamical calculation and experimental confirmation of the density of hole traps in SiO2 films

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[1] Ohmameuda, Toshiaki
[2] Miki, Hiroshi
[3] Asada, Kunihiro
[4] Sugano, Takuo
[5] Ohji, Yuzuru
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Ohmameuda, Toshiaki | 1600年 / 30期
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Silica;
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