Special purpose ultrasonic probes and their characterization

被引：0

作者：

van Leeuwen, W.H. ^{[1
]}

de Raad, J.A. ^{[1
]}

机构：

[1] RTD Quality Services, Rotterdam, Netherlands

来源：

| 1600年 / 02期

关键词：

Defects - Materials testing - Piezoelectric devices - Ultrasonic transducers - Ultrasound;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Two types of special ultrasonic probes are discussed: focused contact probes and radiation resistant probes. Considerations are given on testing and characterisation of these probes and the applicability of standards in this respect. It is explained how to assess the feasibility of a focused contact probe with a particular specification. Both types of probe have found only limited application so far, but their potential for wider use is increasing.

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