Differential conductance imaging of Si and Ge islands deposited on Si(001) by scanning tunneling microscopy

被引：0
作者：
Suganuma, Yoshinori [1 ]
Tomitori, Masahiko [1 ]
机构：
[1] Japan Advanced Inst of Science and, Technology, Ishikawa, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers | 1998年 / 37卷 / 6 B期
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页码：3789 / 3792
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