Anomalous behaviour of silicon single-crystals observed by X-ray diffraction

被引：0

作者：

机构：

[1] Kohno, Atsushi

[2] Aomine, Nobutaka

[3] Soejima, Yuji

[4] Okazaki, Atsushi

来源：

Kohno, Atsushi | 1600年 / 33期

关键词：

Silicon;

D O I：

暂无

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学科分类号：

摘要：

引用

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[1] ANOMALOUS BEHAVIOR OF SILICON SINGLE-CRYSTALS OBSERVED BY X-RAY-DIFFRACTION
KOHNO, A
AOMINE, N
SOEJIMA, Y
OKAZAKI, A
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (9A): : 5073 - 5077
[2] ANOMALOUS TRANSMISSION OF X-RAY IN SILICON SINGLE-CRYSTALS WITH DISLOCATIONS
SHEIKHET, EG
VESELOVS.NV
EFIMOV, ON
FIZIKA TVERDOGO TELA, 1972, 14 (01): : 272 - &
[3] LOOP SHAPED IMAGES OBSERVED IN X-RAY DIFFRACTION MICROGRAPHS OF SILICON SINGLE CRYSTALS
YOSHIMATSU, M
KOHRA, K
SUZUKI, T
KOBAYASHI, T
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1962, 17 (03) : 583 - &
[4] THE X-RAY DIFFRACTION PROPERTIES OF SILICON SINGLE CRYSTALS
BROGREN, G
LINDEN, E
ARKIV FOR FYSIK, 1962, 22 (06): : 535 - 541
[5] ANOMALOUS X-RAY DIFFRACTION IN AL AND CU SINGLE CRYSTALS
SHINODA, G
AMANO, Y
ACTA CRYSTALLOGRAPHICA, 1954, 7 (10): : 635 - 635
[6] DIFFRACTION OF SPATIALLY NONUNIFORM X-RAY BEAMS BY SINGLE-CRYSTALS
SUVOROV, EV
NIKITENK.VI
POLOVINK.VI
SOVIET PHYSICS SOLID STATE,USSR, 1972, 13 (09): : 2253 - &
[7] DETERMINATION OF THE TYPE OF MICRODEFECTS IN DISLOCATIONLESS SILICON SINGLE-CRYSTALS BY THE METHOD OF X-RAY ANOMALOUS TRANSMISSION
TRAININ, AL
SHEIKHET, EG
FIZIKA TVERDOGO TELA, 1979, 21 (01): : 161 - 166
[8] THE ANOMALOUS X-RAY TRANSMISSION THROUGH SILICON SINGLE CRYSTALS
BROGREN, G
HORNSTROM, E
ARKIV FOR FYSIK, 1963, 24 (01): : 81 - 88
[9] MULTIPLE DIFFRACTION LINES IN THE SYNCHROTRON X-RAY TOPOGRAPHS OF ELASTICALLY BENT SILICON SINGLE-CRYSTALS
TUOMI, T
NAUKKARINEN, K
PHYSICAL REVIEW B, 1981, 24 (10): : 6125 - 6128
[10] X-RAY REFLECTION PROPERTIES OF ANNEALED SILICON SINGLE-CRYSTALS
ZAUMSEIL, P
WINTER, U
JOKSCH, S
FREUND, AK
REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (01): : 907 - 910

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