Emissivity and structure in disordered PbO-SiO2 matrices

PbO-SiO2 glasses containing from 35 to 65 mol % PbO have been used in comparing the concentration-dependence curves for bulk structure-sensitive properties. We used the xPbO-(1 - x)SiO2 glass series for x = 0.35-0.65, which were made from chemically pure SiO2 and PbO; the thermostimulated exoelectron emission curves were recorded with a research system, where we used polished surfaces for specimens made as 8.0 × 8.0 × 0.8 mm wafers. An oil-free vacuum of 10-4 Pa was used and the specimens were heated at 20 deg/min; the thermoluminescence curves were recorded at the same time. The specimens had been irradiated with $CHi or γ rays to doses of 106-107 R in air. The carrier-trapping centers produced by the irradiation were identified by ESR. The structures were deduced from the structure-sensitive characteristics: density, hardness, and thermal-expansion coefficient.