ACCURATE MEASUREMENT OF COMPLEX PERMITTIVITY OF LOW-LOSS MIC SUBSTRATE SLABS.

被引：0
|
作者：
Ermert, Helmut
机构：
来源：
| 1974年 / 27卷 / 01期
关键词：
INTEGRATED CIRCUITS - MICROWAVE DEVICES;
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暂无
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学科分类号：
摘要：
A technique is described which makes possible the accurate measurement of the dielectric constant as well as the dielectric loss tangent of plane parallel slabs of any solid-state dielectric material, especially of low-loss microwave-integrated-circuit (MIC) substrates. Slabs of any thickness and any size without being cut, polished, metallized or machined in any manner are suitable for the measurement. The samples are inserted between the two halves of a cylindrical microwave cavity excited in the H//1//1//1-mode. Results for several substrate materials are presented.
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页码：43 / 46
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