DOTTABLE DATA INPUT/OUTPUT AND DATA GATE ORGANIZATION.

被引：0
|
作者：
Anon
机构：
来源：
IBM technical disclosure bulletin | 1985年 / 28卷 / 03期
关键词：
DATA PROCESSING - Testing;
D O I：
暂无
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学科分类号：
摘要：
This module provides both high and low end users of high density memory products with the serial or parallel data bit organization most appropriate to their needs in a single memory chip design by providing the user option of dotting the data I/O or data gate inputs. Also, test time is greatly reduced by the ability to test several bits in parallel.
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页码：1101 / 1102
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