SIMPLE FUNCTIONAL TESTER VERIFIES CHIP PERFORMANCE.

A simple personal-computer-based tester is introduced that is using a custom-built test head which allows to test and analyze semicustom ICs. It is shown how the automatic test equipment (ATE) was improvised using a personal-computer-based logic/timing analyzer combined with a pattern generator and a special test head. The logic/timing analyzer provides the ability to observe and log chip activity using complex data-qualification and triggering schemes. The pattern generator and test head provide a means to apply and synchronize the test patterns and to connect the analyzer to devices under test. Although the setup involves some added design and construction time, it proves to be a low-cost, highly effective means for evaluating chips. Three chips are tested and the data are compared.