首页
学术期刊
论文检测
AIGC检测
热点
更多
数据
Elementary processes during low-energy self-bombardment of Si(100)2×2 - a molecular dynamics study
被引:0
作者
:
Uhlmann, S.
论文数:
0
引用数:
0
h-index:
0
机构:
Univ of Technology Chemnitz, Chemnitz, Germany
Univ of Technology Chemnitz, Chemnitz, Germany
Uhlmann, S.
[
1
]
Frauenheim, Th.
论文数:
0
引用数:
0
h-index:
0
机构:
Univ of Technology Chemnitz, Chemnitz, Germany
Univ of Technology Chemnitz, Chemnitz, Germany
Frauenheim, Th.
[
1
]
Boyd, K.J.
论文数:
0
引用数:
0
h-index:
0
机构:
Univ of Technology Chemnitz, Chemnitz, Germany
Univ of Technology Chemnitz, Chemnitz, Germany
Boyd, K.J.
[
1
]
Marton, D.
论文数:
0
引用数:
0
h-index:
0
机构:
Univ of Technology Chemnitz, Chemnitz, Germany
Univ of Technology Chemnitz, Chemnitz, Germany
Marton, D.
[
1
]
Rabalais, J.W.
论文数:
0
引用数:
0
h-index:
0
机构:
Univ of Technology Chemnitz, Chemnitz, Germany
Univ of Technology Chemnitz, Chemnitz, Germany
Rabalais, J.W.
[
1
]
机构
:
[1]
Univ of Technology Chemnitz, Chemnitz, Germany
来源
:
Radiation Effects and Defects in Solids
|
1997年
/ 141卷
/ 1 -4 pt 1期
关键词
:
Number:;
E656;
Acronym:;
-;
Sponsor:;
DMR-9224377;
NSF;
Sponsor: National Science Foundation;
DFG;
Sponsor: Deutsche Forschungsgemeinschaft;
D O I
:
暂无
中图分类号
:
学科分类号
:
摘要
:
引用
收藏
页码:185 / 198
相关论文
未找到相关数据
未找到相关数据