Elementary processes during low-energy self-bombardment of Si(100)2×2 - a molecular dynamics study

被引:0
作者
Uhlmann, S. [1 ]
Frauenheim, Th. [1 ]
Boyd, K.J. [1 ]
Marton, D. [1 ]
Rabalais, J.W. [1 ]
机构
[1] Univ of Technology Chemnitz, Chemnitz, Germany
来源
Radiation Effects and Defects in Solids | 1997年 / 141卷 / 1 -4 pt 1期
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Number:; E656; Acronym:; -; Sponsor:; DMR-9224377; NSF; Sponsor: National Science Foundation; DFG; Sponsor: Deutsche Forschungsgemeinschaft;
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页码:185 / 198
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