SURFACE ANALYSIS BY LOW ENERGY ION SCATTERING SPECTROSCOPY AND SECONDARY ION MASS SPECTROSCOPY.

被引:0
作者
Nelson, G.C.
机构
来源
| 1600年 / 07期
关键词
Compendex;
D O I
暂无
中图分类号
学科分类号
摘要
SOLIDS
引用
收藏
相关论文
共 48 条
[21]   SPATIAL AND ENERGY DISTRIBUTIONS OF SECONDARY IONS PRODUCED BY ION BOMBARDMENT OF SINGLE CRYSTALS. [J].
Yurasova, V.E. ;
Sysoev, A.A. ;
Samsonov, G.A. ;
Bykhanov, V.M. ;
Nevzorova, I.N. ;
Shelyakin, L.B. .
Radiation Effects, 1973, 20 (1-2) :89-93
[22]   Electrochemical impedance spectroscopy testing on the advanced technology development program lithium-ion cells [J].
Christophersen, Jon P. ;
Glenn, David F. ;
Motloch, Chester G. ;
Wright, Randy B. ;
Ho, Chinh D. ;
Battaglia, Vincent S. .
IEEE Vehicular Technology Conference, 2002, 56 (03) :1851-1855
[23]   Understanding the nucleation and growth of the degenerated surface structure of the layered transition metal oxide cathodes for lithium-ion batteries by operando Raman spectroscopy [J].
Kim, Taehoon ;
Ono, Luis K. ;
Qi, Yabing .
Journal of Electroanalytical Chemistry, 2022, 915
[24]   DIRECT ANALYSIS OF POLYMER CHEMICAL-MIXTURES BY FIELD DESORPTION MASS-SPECTROSCOPY [J].
LATTIMER, RP ;
WELCH, KR .
RUBBER CHEMISTRY AND TECHNOLOGY, 1980, 53 (01) :151-159
[25]   EXPERIMENTS ON THE ANALYSIS OF THE SURFACE OF METALS BY ION ETCHING AND ATOMIC-ABSORPTION SPECTROMETRY [J].
GRUNENBERG, D ;
KOCH, KH ;
LOOSE, W .
ARCHIV FUR DAS EISENHUTTENWESEN, 1980, 51 (02) :73-76
[27]   Concentration of N and P in SiC investigated by time-of-flight secondary ion mass spectrometry (TOF-SIMS) [J].
Acartürk, T. ;
Semmelroth, K. ;
Pensl, G. ;
Saddow, S.E. ;
Starke, U. .
Mater Sci Forum, (453-456)
[28]   OPERATING MECHANISM OF THE OXIDE CATHODE BASED ON AN INVESTIGATION OF THE ELEMENTAL COMPOSITION OF ITS SURFACE BY ION-SCATTERING METHOD. [J].
Tolstoguzov, A.B. ;
Shuppe, G.N. .
Radio Engineering and Electronic Physics (English translation of Radiotekhnika i Elektronika), 1982, 27 (03) :144-148
[29]   Production of energetic neutral particles and low energy electrons from four anode rods ion source [J].
Mostafa, O. A. ;
El-Khabeary, H. ;
Reheem, A. M. Abdel .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2013, 84 (11)
[30]   High homogeneity 25 cm low-energy rf ion source with inherent electron compensation [J].
Dudin, S. V. ;
Rafalskyi, D. V. ;
Zykov, A. V. .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2010, 81 (08)