Complex permittivity measurement techniques for low dielectric constant resins

被引:0
作者
Buckley, L.J.
机构
来源
Polymeric Materials Science and Engineering, Proceedings of the ACS Division of Polymeric Materials Science and Engineering | 1994年 / 71卷
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [31] NONTRADITIONAL ANTENNAS IN COMPLEX DIELECTRIC-CONSTANT MEASUREMENT
    LAPUNOV, SY
    POLONIK, AV
    MEASUREMENT TECHNIQUES USSR, 1990, 33 (11): : 1094 - 1096
  • [32] Measurement of Complex Dielectric Constant Using Optical Method
    Sengupta, Ramonika
    Adhiya, Asha
    Sekhar, K. Satya Raja
    Kaur, Rajwinder
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2019, 68 (06) : 1814 - 1820
  • [33] Direct low frequency permittivity measurement of low loss dielectric materials.
    Dinculescu, S
    Lebey, T
    Loubiere, A
    Ai, B
    JOURNAL DE PHYSIQUE III, 1996, 6 (08): : 991 - 1004
  • [34] Measurement of complex permittivity of dielectric material using partially loaded waveguide
    Nikawa, Y
    Chino, M
    Kikuchi, K
    1997 TOPICAL SYMPOSIUM ON MILLIMETER WAVES - PROCEEDINGS, 1998, : 63 - 66
  • [35] Ellipsometry for measurement of complex dielectric permittivity in millimeter-wave region
    Tsuzukiyama, K
    Sakai, T
    Yamazaki, T
    Hashimoto, O
    33RD EUROPEAN MICROWAVE CONFERENCE, VOLS 1-3, CONFERENCE PROCEEDINGS, 2003, : 487 - 490
  • [36] The low dielectric constant hyperbranched polycarbosilane derived resins with spacing groups
    Long, Quan
    Li, Xia
    Huang, Yawen
    Peng, Qiuxia
    Li, Xian
    Zhu, Liangbo
    Ma, Jiajun
    Ye, Xu
    Yang, Junxiao
    JOURNAL OF APPLIED POLYMER SCIENCE, 2022, 139 (28)
  • [37] Complex Permittivity Measurement of Dielectric Substrate in Sub-THz Range
    Zhu, Hao-Tian
    Wu, Ke
    IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY, 2021, 11 (01) : 2 - 15
  • [38] Complex permittivity measurement of unknown dielectric plates by the cavity resonance method
    Zhang, G
    Kobayashi, Y
    ICEMI '97 - CONFERENCE PROCEEDINGS: THIRD INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS, 1997, : 470 - 473
  • [39] Extended technique for complex permittivity measurement of dielectric films in the microwave region
    Thomas, R
    Dube, DC
    ELECTRONICS LETTERS, 1997, 33 (03) : 218 - 220
  • [40] WIDEBAND MEASUREMENT OF THE COMPLEX PERMITTIVITY OF DIELECTRIC MATERIALS USING A WIDEBAND CAVITY
    SAED, MA
    RIAD, SM
    ELSHABINIRIAD, A
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1989, 38 (02) : 488 - 495