Electron microscopy study of the growth of Ge nanoparticles in SiO2

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Bonafos, C.
Garrido, B.
Lopez, M.
Perez-Rodriguez, A.
Morante, J.R.
Kihn, Y.
Assayag, G. Ben
Claverie, A.
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| 2000年 / American Inst of Physics, Woodbury, NY, USA卷 / 76期
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