THERMAL STABILITY OF Hg1 - xCdxTe CRYSTALS COVERED WITH THE ANODIC OXIDE FILMS.

被引:0
|
作者
Takita, Koki [1 ]
Ipposhi, Takashi [1 ]
Murakami, Kouichi [1 ]
Masuda, Kohzoh [1 ]
Kudo, Hiroshi [1 ]
Seki, Seiji [1 ]
机构
[1] Univ of Tsukuba, Jpn, Univ of Tsukuba, Jpn
来源
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes | 1986年 / 25卷 / 12期
关键词
INFRARED DETECTORS - Materials - OXIDES - Thin Films;
D O I
暂无
中图分类号
TM2 [电工材料]; TN [电子技术、通信技术];
学科分类号
0805 ; 080502 ; 080801 ; 0809 ;
摘要
Hg loss from the near-surface region of Hg//1// minus //xCd//xTe with and without anodic oxide caps by a 60-min heat-treatment has been estimated for x approximately equals 0. 2 and x approximately equals 0. 3 from 40-Mev-O**5**30 backscattering spectra. The Hg loss rate for various heat-treatment temperatures T was compared with the T-dependence of the Hg content of the oxide films. For x approximately equals 0. 2, the Hg loss of a sample with 1000 A oxide film exceeded 1 multiplied by 10**1**7 Hg/cm**2 at T greater than 300 degree C, while that of the uncapped sample reached the same level around T equals 250 degree C. For x approximately equals 0. 3, the Hg loss was not appreciable up to 320 degree C, even for an uncapped sample; however, it exceeded 1 multiplied by 10 **1**7 Hg/cm**2 around T equals 340 degree C, even for a capped sample. Furthermore, the Hg content of anodic oxide films rapidly decreased in the temperature range 250-290 degree C for both x approximately equals 0. 2 and x approximately equals 0. 3. These behaviors suggest that protective effect of the oxide cap against Hg loss decreases with decreasing Hg-content of the films.
引用
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页码:1862 / 1864
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