Gauge capability assessment for high-yield manufacturing processes with truncated distribution

被引：0

作者：

Yock Wah Lai ^{[1
]}

Ek Peng Chew ^{[1
]}

机构：

[1] Department of Industrial Engineering, National University of Singapore, 10 Kent Ridge Crescent, Singapore 119260, Singapore

来源：

关键词：

Gauge repeatability and reproducibility (GRR) studies;

D O I：

10.1080/08982110108918642

中图分类号：

学科分类号：

摘要：

引用

页码：203 / 210