Cryostatic setup for the low-temperature measurement of thermal diffusivity with the photothermal method

被引:0
|
作者
机构
[1] Bertolotti, M.
[2] Liakhou, G.
[3] Li Voti, R.
[4] Paoloni, S.
[5] Sibilia, C.
[6] Sparvieri, N.
来源
Bertolotti, M. | 1600年 / American Inst of Physics, Woodbury, NY, United States卷 / 66期
关键词
641.1 Thermodynamics - 644.4 Cryogenics - 644.5 Cryogenic Equipment and Components - 708.3.1 High Temperature Superconducting Materials - 741.1 Light/Optics - 944.6 Temperature Measurements;
D O I
暂无
中图分类号
学科分类号
摘要
8
引用
收藏
相关论文
共 50 条
  • [1] A cryostatic setup for the low-temperature measurement of thermal diffusivity with the photothermal method
    Bertolotti, M
    Liakhou, G
    Voti, RL
    Paoloni, S
    Sibilia, C
    Sparvieri, N
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (12): : 5598 - 5602
  • [2] LOW-TEMPERATURE THERMAL-DIFFUSIVITY MEASUREMENT BY LASER-FLASH METHOD
    KOGURE, Y
    MUGISHIMA, T
    HIKI, Y
    JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1986, 55 (10) : 3469 - 3478
  • [3] Low diffusivity measurement using new photothermal method
    Fung, PCW
    Wong, PK
    Tam, HL
    9TH INTERNATIONAL CONFERENCE ON PHOTOACOUSTIC AND PHOTOTHERMAL PHENOMENA, CONFERENCE DIGEST, 1996, : 415 - 416
  • [4] Thermal diffusivity measurement by lock-in photothermal shadowgraph method
    Cifuentes, A.
    Alvarado, S.
    Cabrera, H.
    Calderon, A.
    Marin, E.
    JOURNAL OF APPLIED PHYSICS, 2016, 119 (16)
  • [5] Proposal of three terminal method for low temperature thermal diffusivity measurement
    Fujishiro, H
    Ikebe, M
    Nakasato, K
    Naito, T
    CZECHOSLOVAK JOURNAL OF PHYSICS, 1996, 46 : 2761 - 2762
  • [6] LOW-TEMPERATURE THERMAL-DIFFUSIVITY IN ORIENTED POLYETHYLENE
    KOGURE, Y
    HIKI, Y
    MUGISHIMA, T
    KAWASAKI, K
    NAKAMURA, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1987, 26 : 1483 - 1484
  • [7] A Theoretical Study of Photothermal Pulsed Radiometry Method for the Thermal Diffusivity Measurement
    Yook, Hyungkyu
    Lee, Kwangai
    Yoo, Jaisuk
    Kim, Hyunjung
    TRANSACTIONS OF THE KOREAN SOCIETY OF MECHANICAL ENGINEERS B, 2005, 29 (01) : 27 - 34
  • [8] New photothermal deflection method for thermal diffusivity measurement of semiconductor wafers
    Bertolotti, M
    Dorogan, V
    Liakhou, G
    Voti, RL
    Paoloni, S
    Sibilia, C
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1997, 68 (03): : 1521 - 1526
  • [9] Simultaneous measurement of temperature, thermal diffusivity, thermal conductivity and spectral emissivity by photothermal radiometry
    Broussely, M
    Levick, A
    Edwards, G
    JOURNAL DE PHYSIQUE IV, 2005, 125 : 627 - 630
  • [10] PHOTOTHERMAL RADIOMETRY MEASUREMENT OF THERMAL-DIFFUSIVITY
    QIAN, L
    LI, PZ
    APPLIED OPTICS, 1990, 29 (28): : 4241 - 4243