X-ray reflectivity investigation of thin p-type porous silicon layers

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作者：
Buttard, D. [1 ]
Dolino, G. [1 ]
Bellet, D. [1 ]
Baumbach, T. [1 ]
Rieutord, F. [1 ]
机构：
[1] Universite Joseph Fourier, Saint-Martin-d'Heres, France
来源：
Solid State Communications | 1998年 / 109卷 / 01期
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