IN-CIRCUIT TESTING USING MODERN HARDWARE - 1, 2/ IN-CIRCUIT-TESTEN MIT MODERNER HARDWARE - 1, 2.

被引：0

作者：

REUBER, WOLFGANG

机构：

来源：

| 1982年 / V 31卷 / N 10期

关键词：

ELECTRONIC EQUIPMENT TESTING - IN-CIRCUIT TESTING;

D O I：

暂无

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学科分类号：

摘要：

HARDWARE POSSIBILITIES OF A MODERN IN-CIRCUIT TESTING SYSTEM ARE CONSIDERED. THE ADVANTAGES AS WELL AS PITFALLS OF MODERN HARDWARE ARE POINTED OUT. REQUIREMENTS FOR TESTING ANALOGAND DIGITAL DEVICES ARE DISCUSSED AND COMPARED. IN GERMAN.

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页码：65 / 68