Effect of Thermal Fluctuation in Josephson Junction

被引：0
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作者：
Xie, Hong [1 ]
Chen, Jun [1 ]
机构：
[1] Yunyang Teachers College, Danjiangkou 442700, China
来源：
Jianghan Shiyou Xueyuan Xuebao/Journal of Jianghan Petroleum Institute | 2003年 / 25卷 / 03期
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摘要：
The effect of O-U noise on volt-ampere properties in Josephson Junction is discussed. The result shows that when thermal fluctuation effect is considered, the curve of volt-ampere property is rounded, with the increase of noise correlation time, zero-voltage current increases, but when the thermal fluctuation parameter reduces to half of it. The rounding in volt-ampere curve vanishes.
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页码：156 / 157
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