Electronic characterisation of oligomeric materials for thin film transistor applications

被引：0
|
作者：
Salih, A.J. [1 ]
Haynes, D.M. [1 ]
Hepburn, A.R. [1 ]
机构：
[1] Univ of Coll of Swansea, Swansea, United Kingdom
来源：
Synthetic Metals | 1995年 / 71卷 / 1 -3 pt 3期
关键词：
The authors wsh to exprc~s their gratitude to J.M.Maud for material synthesis and to J.M. Marsahall and The support of the U.K. Science and Engineering research council under grant GR/ H 13437 is aknowledged thank the Ministry of Higher Education and Scientific Research in Iraq for financial support;
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摘要：
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页码：2257 / 2258
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