Multiscale self-organization of the organic semiconductor α-quinquethiophene

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[1] Melucci, Manuela
[2] Gazzano, Massimo
[3] Barbarella, Giovanna
[4] Cavallini, Massimiliano
[5] Biscarini, Fabio
[6] Maccagnani, Piera
[7] Ostoja, Paolo
来源
Barbarella, G. (barbarella@isof.cnr.it) | 1600年 / American Chemical Society卷 / 125期
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Evaporation - Powders - Thin films - X ray diffraction analysis;
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摘要
We show that thin films grown by vacuum sublimation, or formed by melted powders, of semiconductor α-quinquethiophene (T5) exhibit a hierarchical self-affinity organization that spans scales from tens of nanometers to hundreds of micrometers. T5 organization was investigated by x-ray diffraction (XRD), atomic force microscopy (AFM), and optical microscopy. XRD showed that vacuum-evaporated T5 films were characterized by a preferred orientation of the hOO planes parallel to the glass substrate. Melting of the films followed by rapid quenching to room temperature led to the formation of micrometer-sized, single-crystal-like structures, characterized by uniaxially aligned stripes. XRD proved that the melting-quenching process enhanced molecular ordering and increased the size of domains with the molecule's long axes tilted by about 65° with respect to the substrate plane and piled up side-by-side along parallel columns. AFM measurements on the melt-quenched structures showed that a hierarchical architecture was built by reiteration across multiple length scales of the same recurring motif. Because of the tendency of T5 to form highly crystalline vacuum-evaporated thin films, a field-effect hole mobility comparable to state-of-the-art FET mobility of α-sexithiophene films was reached, without any attempt to optimize deposition conditions.
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