Exploiting metal coating of carbon nanotubes for scanning tunneling microscopy probes

被引：0

作者：

Murata, Yuya ^{[1
]}

Yoshimoto, Shinya ^{[3
]}

Kishida, Masaru ^{[1
]}

Maeda, Daisuke ^{[1
]}

Yasuda, Tatsuro ^{[1
]}

Ikuno, Takashi ^{[1
]}

Honda, Shin-Ichi ^{[1
]}

Okado, Hideaki ^{[2
]}

Hobara, Rei ^{[3
]}

Matsuda, Iwao ^{[3
]}

Hasegawa, Shuji ^{[3
]}

Oura, Kenjiro ^{[1
,2
]}

Katayama, Mitsuhiro ^{[1
]}

机构：

[1] Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan

[2] Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan

[3] Department of Physics, School of Science, University of Tokyo, Hongo, Bunkyo-ku, Tokyo 113-0033, Japan

来源：

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2005年 / 44卷 / 7 B期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：5336 / 5338

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