Wear of the atomic force microscope tip under light load, studied by atomic force microscopy

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Laboratory of Tribology, Faculty of Engineering, Tohoku University, Sendai 980-77, Japan [1 ]
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ULTRAMICROSCOPY | / 1卷 / 11-16期
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Calculations - Fabrication - Fatigue of materials - Fracture - Geometry - Image quality - Imaging techniques - Scanning - Silicon nitride - Surface roughness - Wear of materials;
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