Sub-micron resolution depth profiling of thin coatings using step-scan photoacoustic FT-IR spectroscopy

被引：0

作者：

Polaroid Corporation, Analytical Research and Development, 1265 Main Street, W4-1D, Waltham, MA 02254, United States ^{[1
]}

不详 ^{[2
]}

机构：

来源：

Prog Nat Sci | / SPEC. ISS.卷 / S10-S13期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Depth profiling

引用

共 50 条

[1] Sub-micron resolution depth profiling of thin coatings using step-scan photoacoustic FT-IR spectroscopy
Gregoriou, VG
Hapanowicz, R
PROGRESS IN NATURAL SCIENCE, 1996, 6 : S10 - S13
[2] Sub-micron resolution depth profiling of thin coatings using step-scan photoacoustic FT-IR spectroscopy
Gregoriou, VG
Hapanowicz, R
9TH INTERNATIONAL CONFERENCE ON PHOTOACOUSTIC AND PHOTOTHERMAL PHENOMENA, CONFERENCE DIGEST, 1996, : 298 - 299
[3] DEPTH PROFILING OF OXIDIZED COAL BY STEP-SCAN PHOTOACOUSTIC FT-IR SPECTROSCOPY
MICHAELIAN, KH
APPLIED SPECTROSCOPY, 1991, 45 (02) : 302 - 304
[4] Applications of step-scan FT-IR photoacoustic spectroscopy to thin-coatings characterization
Gregoriou, VG
Hapanowicz, R
SPECTROSCOPY, 1997, 12 (05) : 37 - &
[5] Advances in photoacoustic step-scan FT-IR spectroscopy
Drapcho, DL
Crocombe, RA
Seebode, J
MIKROCHIMICA ACTA, 1997, : 585 - 588
[6] Effect of inclusions in polymeric coatings on quantitative surface depth profiling: Modeling and step-scan photoacoustic FT-IR spectroscopy.
Katti, KS
Urban, MW
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2001, 222 : U350 - U350
[7] Step-scan FT-IR photoacoustic spectroscopy: The signal phase
Wahls, MWC
Toutenhoofd, JP
LeyteZuiderweg, LH
deBleijser, J
Leyte, JC
APPLIED SPECTROSCOPY, 1997, 51 (04) : 552 - 557
[8] Quantitative depth profile analysis of micrometer-thick multilayered thin coatings using step-scan FT-IR photoacoustic spectroscopy
Gregoriou, VG
Rodman, SE
ANALYTICAL CHEMISTRY, 2002, 74 (10) : 2361 - 2369
[9] FT-IR STEP-SCAN PHOTOACOUSTIC PHASE-ANALYSIS AND DEPTH PROFILING OF CALCIFIED TISSUE
SOWA, MG
MANTSCH, HH
APPLIED SPECTROSCOPY, 1994, 48 (03) : 316 - 319
[10] DEPTH PROFILING AND SIGNAL SATURATION IN PHOTOACOUSTIC FT-IR SPECTRA MEASURED WITH A STEP-SCAN INTERFEROMETER
MICHAELIAN, KH
APPLIED SPECTROSCOPY, 1989, 43 (02) : 185 - 190

← 1 2 3 4 5 →