ALTERNATIVE TO SCAN DESIGN METHODS FOR SEQUENTIAL MACHINES.

被引：5

作者：

Saluja, Kewal K. ^{[1
]}

Dandapani, Ramaswami ^{[1
]}

机构：

[1] Univ of Wisconsin, Madison, WI, USA, Univ of Wisconsin, Madison, WI, USA

来源：

IEEE Transactions on Computers | 1986年 / C-35卷 / 04期

关键词：

COMPUTER PROGRAMMING - Algorithms;

D O I：

10.1109/TC.1986.1676776

中图分类号：

学科分类号：

摘要：

The problem of testing sequential machines using a checking experiment is investigated. An algorithm is given to augment sequential machines by adding extra input(s) to make them testable. In addition, a circuit modification method that is similar to scan methods is presented which can be used to test the augmented machine by the checking experiment. A justification of this method for a VLSI environment is given by determining the overheads.

引用

页码：384 / 388