Fabrication of 1 μm Gate Diamond FET Using Self-Aligned Gate Process
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作者:
Umezawa, Hitoshi
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School of Science and Engineering, Waseda University, 3-4-1 Okubo, Shinjuku-ku, Tokyo 169-0072, JapanSchool of Science and Engineering, Waseda University, 3-4-1 Okubo, Shinjuku-ku, Tokyo 169-0072, Japan
Umezawa, Hitoshi
[1
]
Kitatani, Kenich
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School of Science and Engineering, Waseda University, 3-4-1 Okubo, Shinjuku-ku, Tokyo 169-0072, JapanSchool of Science and Engineering, Waseda University, 3-4-1 Okubo, Shinjuku-ku, Tokyo 169-0072, Japan
Kitatani, Kenich
[1
]
Kinumura, Kengo
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School of Science and Engineering, Waseda University, 3-4-1 Okubo, Shinjuku-ku, Tokyo 169-0072, JapanSchool of Science and Engineering, Waseda University, 3-4-1 Okubo, Shinjuku-ku, Tokyo 169-0072, Japan
Kinumura, Kengo
[1
]
Seto, Nobuyuki
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School of Science and Engineering, Waseda University, 3-4-1 Okubo, Shinjuku-ku, Tokyo 169-0072, JapanSchool of Science and Engineering, Waseda University, 3-4-1 Okubo, Shinjuku-ku, Tokyo 169-0072, Japan
Seto, Nobuyuki
[1
]
Tsugawa, Kazuo
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School of Science and Engineering, Waseda University, 3-4-1 Okubo, Shinjuku-ku, Tokyo 169-0072, JapanSchool of Science and Engineering, Waseda University, 3-4-1 Okubo, Shinjuku-ku, Tokyo 169-0072, Japan
Tsugawa, Kazuo
[1
]
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机构:
Kawarada, Hiroshi
[1
]
机构:
[1] School of Science and Engineering, Waseda University, 3-4-1 Okubo, Shinjuku-ku, Tokyo 169-0072, Japan
来源:
New Diamond and Frontier Carbon Technology
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