Imaging of spheres and surface profiling by confocal microscopy

被引：0

作者：

Aguilar, J.Felix ^{[1
,3
]}

Lera, Mario ^{[2
]}

Sheppard, Colin J.R. ^{[1
,4
]}

机构：

[1] Department of Physical Optics, School of Physics A 28, University of Sydney, Sydney, NSW 2006, Australia

[2] Dipartimento di Ingegneria Meccanica, Università di Cagliari, Piazza d'Armi 1, 09123 Cagliari, Italy

[3] Inst. Nac. Astro-Fis. Opt./Electron., S. Maria Tonantzintla, Puebla 72840, Mexico

[4] Australian Key Ctr. Microsc./M., University of Sydney, Sydney, NSW 2006, Australia

来源：

Applied Optics | 2000年 / 39卷 / 25期

关键词：

Light scattering - Masks - Microscopic examination - Surface structure;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

An investigation of the imaging of spheres can aid in understanding details of the surface profiling method of confocal microscopy. The use of semicircular masks to eliminate artifacts in confocal profiling is investigated experimentally. A theoretical treatment of image formation for a spherical object in reflection confocal microscopy is presented. For large spheres a simple approximate theory is described and is shown to be equivalent to application of the Kirchhoff theory for surface scattering. © 2000 Optical Society of America.

引用

页码：4621 / 4628