PROGRAMMABLE CURRENT LOAD FOR TESTING INTEGRATED CIRCUITS.

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作者：
Ayers, R.L.
Stephens, G.B.
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来源：
IBM technical disclosure bulletin | 1984年 / 27卷 / 4 A期
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摘要：
This article describes a circuit which provides constant current load (sync or source) for testing integrated circuits. The circuit can be used with any general-purpose integrated circuit testers to provide the testing function. The programmable current is switched at functional test speeds and requires no software development and minimal hardware cost.
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页码：1940 / 1941
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