PROGRAMMABLE CURRENT LOAD FOR TESTING INTEGRATED CIRCUITS.

被引：0

作者：

Ayers, R.L.

Stephens, G.B.

机构：

来源：

IBM technical disclosure bulletin | 1984年 / 27卷 / 4 A期

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摘要：

This article describes a circuit which provides constant current load (sync or source) for testing integrated circuits. The circuit can be used with any general-purpose integrated circuit testers to provide the testing function. The programmable current is switched at functional test speeds and requires no software development and minimal hardware cost.

引用

页码：1940 / 1941

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