Experiments using a nano-machining instrument for nano-cutting brittle materials

被引:1
|
作者
Department of Mechatronics, Tohoku University, Sendai, Japan [1 ]
不详 [2 ]
机构
基金
美国国家科学基金会;
关键词
Brittleness - Capacitance - Cutting equipment - Feedback control - Piezoelectric devices - Probes;
D O I
10.1016/S0007-8506(07)62984-9
中图分类号
学科分类号
摘要
This paper presents a nano-machining instrument, which was developed for conducting nano-cutting experiments especially on brittle materials. A PZT tube scanner is employed to accomplish a maximum depth of cut of 4 μm with 0.1 nm resolution, and a length of cut of 20 μm. The cutting motions are feedback-controlled by using the output of a capacitance probe. There are two force sensors to measure thrust and cutting forces with a resolution of sub-milliNewtons. The sample is kinematically mounted on the PZT scanner, and the tilt of the sample can be adjusted precisely. Experiments of nano-scratching and nano-cutting on single crystal silicon were carried out.
引用
收藏
页码:439 / 442
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