HIGH-SPEED WIRING TEST SYSTEM FOR PRINTED WIRING BOARD.

被引：0

作者：

Itoh, Seiichi

Hoshiai, Fumihiro

Suzuki, Masatoshi

机构：

来源：

NEC Research and Development | 1978年 / 49期

关键词：

D O I：

暂无

中图分类号：

TN7 [基本电子电路];

学科分类号：

080902 ;

摘要：

This paper describes a system which is used to electrically test the wiring condition of printed wiring boards or multilayer boards. The system is intended to test printed wiring boards of various kinds and patterns while minimizing preparation work and test time. The system consists of a minicomputer as the center, a disk cartridge unit as a data input device, a scanner using CMOS IC packages and a probe unit consisting of about 16,000 test points which can be connected at one time.

引用

页码：32 / 39

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