Correlating charge-to-breakdown with constant-current injection to gate oxide lifetime under constant-voltage stress

被引：0
作者：
Eriguchi, Koji [1 ]
Uraoka, Yukiharu [1 ]
机构：
[1] Matsushita Electric Ind. Co, Ltd, Osaka, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers | 1996年 / 35卷 / 2 B期
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D O I：
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学科分类号：
摘要：
10
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页码：1535 / 1539
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