Temperature strength of monocrystalline tungsten electrodes for thermionic energy converters

被引：0
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作者：
Dekhtyar, A.I.
Kobyakov, V.P.
机构：
来源：
Atomnaya Energiya | 1995年 / 79卷 / 01期
关键词：
Creep - Creep testing - Crystal defects - Electrodes - Heat resistance - Metallographic microstructure - Single crystals - Tungsten;
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摘要：
Results of investigations of the high-temperature creep, defect structure and specific features of technology for preparation of monocrystalline tungsten and its products are generalized. The technology is aimed at production of high-temperature tungsten emitters for thermionic converters of thermal energy into electric one. Substantial advantage of monocrystalline ″gas-phase″ tungsten in comparison with polycrystalline tungsten of different origin is found. This conclusion is based on the results of tests of high-temperature creep of the materials.
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页码：13 / 18
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