Experimental developments to obtain real-time x-ray diffraction measurements in plate impact experiments

被引:0
|
作者
Institute for Shock Physics, Department of Physics, Washington State University, Pullman, WA 99164-2816, United States [1 ]
机构
来源
Rev. Sci. Instrum. | / 10卷 / 4008-4014期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [1] Experimental developments to obtain real-time x-ray diffraction measurements in plate impact experiments
    Gupta, YM
    Zimmerman, KA
    Rigg, PA
    Zaretsky, EB
    Savage, DM
    Bellamy, PM
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1999, 70 (10): : 4008 - 4014
  • [2] Real-time x-ray diffraction at the impact surface of shocked crystals
    Turneaure, Stefan J.
    Gupta, Y. M.
    JOURNAL OF APPLIED PHYSICS, 2012, 111 (02)
  • [3] REAL-TIME X-RAY POWDER DIFFRACTION EXPERIMENTS ON COCOA BUTTER.
    Schenk, H.
    van Malssen, K. F.
    Peschar, R.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1996, 52 : C399 - C399
  • [4] Real-time x-ray diffraction at the impact surface of shocked crystals
    Turneaure, Stefan J.
    Gupta, Y.M.
    Journal of Applied Physics, 2012, 111 (02):
  • [5] Real-time x-ray diffraction measurements of shocked polycrystalline tin and aluminum
    Morgan, Dane V.
    Macy, Don
    Stevens, Gerald
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2008, 79 (11):
  • [6] Real-time X-ray diffraction measurements of structural dynamics and polymorphism in diindenoperylene growth
    Kowarik, Stefan
    Gerlach, Alexander
    Sellner, Stefan
    Cavalcanti, Leide
    Konovalov, Oleg
    Schreiber, Frank
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2009, 95 (01): : 233 - 239
  • [7] Real-time X-ray diffraction measurements of structural dynamics and polymorphism in diindenoperylene growth
    Stefan Kowarik
    Alexander Gerlach
    Stefan Sellner
    Leide Cavalcanti
    Oleg Konovalov
    Frank Schreiber
    Applied Physics A, 2009, 95 : 233 - 239
  • [8] X-ray diffraction provides nonthermal measurements in real time
    不详
    LASER FOCUS WORLD, 2001, 37 (05): : 15 - 15
  • [9] Real-time x-ray diffraction measurements of the phase transition in KCl shocked along [100]
    d'Almeida, T
    Gupta, YM
    PHYSICAL REVIEW LETTERS, 2000, 85 (02) : 330 - 333
  • [10] Real-time X-ray diffraction imaging for semiconductor wafer metrology and high temperature in situ experiments
    Danilewsky, A. N.
    Wittge, J.
    Hess, A.
    Croell, A.
    Rack, A.
    Allen, D.
    McNally, P.
    Rolo, T. dos Santos
    Vagovic, P.
    Baumbach, T.
    Garagorri, J.
    Elizalde, M. R.
    Tanner, B. K.
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2011, 208 (11): : 2499 - 2504