Bargas et al. (1998) have shown a giant optical field enhancement at the tip-sample junction of a scanning tunneling microscope. The magnitude of the field enhancement obtained is larger than expected from abundant calculation performed for different tip-sample geometries. In this work, it is shown that when the metallic tip approached to a sample to subnanometer distances, and it is shinned with light, the field enhancement at the tip is increased by a resonant mechanism, yielding light scattering signals extremely sensitive to the tip-sample distance. Experimental results indicate subnanometer sensitivity and a model is given, consistent with the results.