The problem of contrast formation in the case of the conductive, non-periodical objects of planar symmetry in mirror electron microscopy is dealt with, giving a formula which is a new solution to the problem and describes the dependence of the disturbing electric field at the specimen surface on the derivative s prime (x) of the electron trajectors displacement. The displacement is the result of the way the observed field left bracket which we call the disturbing field right bracket affects an illuminating electron beam. The formula can be used to calculate the electric field distribution at the specimen surface basing on the measured electron beam density distribution on the instrument's screen.