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- [23] IDENTIFICATION OF A DEFECT IN A SEMICONDUCTOR - EL2 IN GAAS PHYSICAL REVIEW B, 1986, 34 (10): : 7192 - 7202
- [25] PHOTOQUENCHING AND PHOTOINDUCED-RECOVERY PROPERTIES OF THE EL2 DEFECT IN GAAS - EVIDENCE AGAINST THE IDENTIFICATION OF EL2 WITH THE ISOLATED ASGA DEFECT PHYSICAL REVIEW B, 1989, 39 (17): : 13001 - 13004
- [26] ATOMIC MODEL FOR THE EL2 DEFECT IN GAAS - COMMENT PHYSICAL REVIEW B, 1988, 37 (05): : 2722 - 2723
- [27] ATOMIC MODEL FOR THE EL2 DEFECT IN GAAS - COMMENT PHYSICAL REVIEW B, 1989, 39 (03): : 1966 - 1966
- [28] ATOMIC MODEL FOR THE EL2 DEFECT IN GAAS - REPLY PHYSICAL REVIEW B, 1989, 39 (03): : 1967 - 1969
- [29] REGENERATION OF THE EL2 DEFECT IN HYDROGEN PASSIVATED GAAS GALLIUM ARSENIDE AND RELATED COMPOUNDS 1993, 1994, 136 : 697 - 702