Atomic scale stresses and strains in Ge/Si(001) nanopixels: An atomistic simulation study

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[1] Makeev, Maxim A.
[2] 1,Yu, Wenbin
[3] 1,Madhukar, Anupam
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Makeev, M.A. (makeev@usc.edu) | 1600年 / American Institute of Physics Inc.卷 / 96期
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