Rigorous dispersive characterization of microstrip cross and tee junctions

被引：0
|
作者：
Wu, Shih-Chang [1 ]
Yang, Hung-Yu [1 ]
Alexopoulos, Nicolaos G. [1 ]
机构：
[1] Univ of California, Electr Eng Dep,, Los Angeles, CA, USA
来源：
IEEE MTT-S International Microwave Symposium Digest | 1990年 / 3卷
关键词：
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页码：1151 / 1154
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