Rigorous dispersive characterization of microstrip cross and tee junctions

被引：0

作者：

Wu, Shih-Chang ^{[1
]}

Yang, Hung-Yu ^{[1
]}

Alexopoulos, Nicolaos G. ^{[1
]}

机构：

[1] Univ of California, Electr Eng Dep,, Los Angeles, CA, USA

来源：

IEEE MTT-S International Microwave Symposium Digest | 1990年 / 3卷

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D O I：

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摘要：

引用

页码：1151 / 1154

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